Yam Ontology 10.5281/zenodo.8253726

 

Curator

  • Afolabi Agbona, IITA

Lead scientist

  • Asrat Amele,  Breeder, IITA

Contributors

  • Denis Cornet, CIRAD

 Bowen University, Nigeria

  • Bolanle Otegbayo
  • Abiola Tanimola,
  • Oroniran Oluyinka

Crop lead center

Collaborators

 

Bowen

Navigation

=Term, =Trait, =Method, and =Scale
Concept details
Key Value
method_id CO_343:0010089
method_name Anthracnose incidence - Estimation
ontology_id CO_343
ontology_name Yam
method_class Computation
method_description Compute the proportion of anthracnose damaged individuals or their parts , commonly the portion of plant units in a plot. Count anthracnose disease ?blight? or leaf spot affected plants in plot twice (First inspection at 10 to 12 weeks post planting and second inspection after 2 to 4 weeks before harvesting ) and compute the proportion of damanged
formula Number of infected plants in a plot divided by total number of plants in a plot times 100. OR Sum of the proportion of leaf area damage of N plants in plot divided by N
method_reference IITA, working documents
language EN
created_at 2022-11-07-09:06:33