Yam Ontology 10.5281/zenodo.8253726

 

Curator

  • Afolabi Agbona, IITA

Lead scientist

  • Asrat Amele,  Breeder, IITA

Contributors

  • Denis Cornet, CIRAD

 Bowen University, Nigeria

  • Bolanle Otegbayo
  • Abiola Tanimola,
  • Oroniran Oluyinka

Crop lead center

Collaborators

 

Bowen
Navigation

=Term, =Trait, =Method, and =Scale
Concept details
Trait: Leaf Width
Method: Leaf width - computation
Scale: cm
Key Value
variable_id CO_343:0000471
variable_name Leaf width measurement in cm
variable_label Lfwdt_Comp_cm
ontology_id CO_343
ontology_name Yam
context_of_use Characterization trial
growth_stage Vegetative
institution IITA
scientist A.Amele
date 2016-05-18 00:00:00
crop Yam
language EN
created_at 2022-11-07-09:06:33