Wheat Ontology 
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Curators Rosemary Shrestha, CIMMYT Julian Pietragalla, IBP GCP
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Contributors CIMMYT - Carlos Guzmán, Hector González, Enrique Autrique, Javier Pena, Pawan Singh, Matthew Reynolds, Tom Payne, Velu Govindan INRAE - Cyril Pommier JIC - Luzie Winge Cornell Univ. - David Waring |
Crop lead center
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Collaborators
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Navigation
=Term, 
=Trait, 
=Method, and 
=Scale
Variables
Concept details
| Key | Value |
|---|---|
| method_id | CO_321:0001551 |
| method_name | SLA Measurement |
| ontology_id | CO_321 |
| ontology_name | Wheat |
| method_class | Measurement |
| method_description | Leaf area of flag leaf or all laminas is measured. Then the leaves are oven dried at 60-70oC for 48h and the dry weight is recorded. Then, the specific leaf area is calculated as the ratio of leaf area to dry mass SLA= leaf area/dry mass. |
| language | EN |
| created_at | 2023-09-01-12:59:34 |