Wheat Ontology 10.5281/zenodo.8253720

Curators

Rosemary Shrestha, CIMMYT

Julian Pietragalla, IBP GCP

 

Contributors

CIMMYT - Carlos Guzmán, Hector González, Enrique Autrique, Javier Pena, Pawan Singh, Matthew Reynolds, Tom Payne, Velu Govindan


INRAE - Cyril Pommier

JIC - Luzie Winge

Cornell Univ. - David Waring

Crop lead center

Collaborators

 

 

 

Navigation

=Term, =Trait, =Method, and =Scale
Concept details
Trait: Leaf thickness
Method: LeafThk Measurement
Scale: µm
Key Value
variable_id CO_321:0001276
variable_name LeafThk_M_um
ontology_id CO_321
ontology_name Wheat
variable_synonyms LEAFTHK_mm
context_of_use Research-intensive characterization
variable_xref BMS_29113
institution CIMMYT
scientist Rosemary Shrestha, Julian Pietragalla
date 2014-09-23T00:00:00
crop Wheat
language EN
created_at 2023-09-01-12:59:34